Direct Dock Probe Cards

Direct Dock Probe Cards

Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Our Direct Dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.

Nidec SV Probe offers a variety of probing solutions that align with this type of testing platform. Our turnkey services are ideal for direct dock and we can handle your entire project from PCB design to probe card assembly.

Contact your Nidec SV Probe Representative so we can help you find the right Direct Dock product for your vertical testing needs.

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