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Nidec SV Probe is a global provider of high-quality, advanced semiconductor testing solutions. Whatever the application, our global team can help you find the right testing solution!
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MEMSFlex™ Probes
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Trio™ Vertical Probe Cards
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ELEVATE YOUR TEST
B2™ 垂直針
B2™ 垂直針
SV TCLのB2垂直プローブカードは、バックリングビーム技術を用いる事で、超マルチDUTと狭ピッチ対応を実現しました。
(特徴)
・最大ピン数:3000ピン
・最小ピッチ:55um
・低針圧によりパッド下ダメージを低減
・アルミパッドに対し安定したコンタクトと小さなプローブ痕
B2製品に関しては、お気軽にSV TCL営業までお問い合わせください。
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Trio™ Vertical
Nidec SV Probe's Trio™ is a reliable vertical solution for advanced wafer testing challenges, specifically full array and parallel ...
Vertical Space Transformers
With our vertical technologies an interconnect, otherwise known as a space transformer (ST), is used between the printed circuit ...
LCD Driver Probe Cards
LCD Driver devices are utilized in some of the most popular high-definition products such as televisions, and smartphones, but ...
Ceramic Blade
Nidec SV Probe offers a variety of ceramic blades and blade probe cards. Click on the image to find out more about our ceramic ...
CMOS Image Sensor (CIS)
CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems.
Direct Dock Probe Cards
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Our ...
Venture™ Cantilever
Nidec SV Probe's Venture™ line of cantilever probe cards, represents the finest epoxy technology on the market and are perfect ...
Metrology
Nidec SV Probe has a wide variety of world-class analytical resources, click on the image at the left for more information.
B3™ Vertical
Nidec SV Probe’s B3™ Vertical probe cards are an economical cantilever alternative. Click on the image to learn more about ...
MEMSFlex™ Probes
Nidec SV Probe proprietary MEMSFlex™ Probes are a perfect complement to our probe card technologies, ideal for many advanced ...